WO3 powder, as an inorganic electrochromic material, is the most commonly used electrochromic material for preparing the electrochromic layer (electrochromic film) of electrochromic devices. And it is important to carry out X-ray diffraction analysis (XRD analysis) of the prepared WO3 film. In this regard, some experts said that as the tungsten trioxide film produced is very thin, if the film coated on the substrate is directly used for XRD analysis, the weak diffraction peak of the film will be replaced by a stronger substrate diffraction peak.
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Therefore, the experts used the WO3 powder obtained under the same conditions as the WO3 electrochromic thin film instead of the film for XRD analysis. The tungsten trioxide powder sample were measured by RigakaD/max2500v/pc diffractometer, using CuKα radiation, and the diffracted beam was filtered by Ni monochromator. The wavelength was λ=0.15418nm, the tube pressure was 40KV, the tube flow was 200mA, and the scanning angle range was selected from 10 to 90o. The synthetic powder was subjected to phase analysis, and the XRD diffraction pattern was analyzed using Jade software. The standard XRD card of WO3 has a card edge number of 20-1324 and its crystal form is an orthorhombic crystal.
