
Tungsten needle is an important part of a wafer probe card, so it is also known as tungsten probe in such a probe card. According to the experts, a probe card, as a main tool for wafer testing, is usually composed of a test circuit board and a conical tungsten needle bent at 95-105 degrees on the circuit board. During the test, the tip of the tungsten probe is directly contacted with the pad of the wafer to be tested,…