It is reported that the Ta doping tungsten trioxide film, that is, the W-Ta oxide nano composite film, has superior electrochemical stability and proton conduction performance than the pure tungsten trioxide film. While there are few studies on the microstructure and electrochemical properties of tungsten trioxide films with different Ta doping contents.
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Therefore, some experts have prepared Ta doped tungsten trioxide electrochromic films with different Ta doping concentrations by magnetron sputtering method, and studied their effects on the electrochromic properties of Ta-doped tungsten trioxide films. They expressed Ta-doped tungsten trioxide films of different Ta doping content as W1-xTaxO3, wherein x is the doping amount of Ta element relative to W element in the film. In addition, X-ray photoelectron spectroscopy (XPS) method was used to determine the x values in the Ta doped tungsten trioxide electrochromic film samples, which were 0%, 5%, 10%, 15%, 25% and 35%, respectively.
